INDUSTRY

Semiconductor Manufacturing
IC Testing
The analysis of failures in complex integrated circuits is possible by focusing the optical beam of high power lasers on the IC inducing local currents in the circuitry.
Products:
EYP-BAL-0808-07000-4020-CDL02-0000
EYP-BAL-0808-08000-4020-CMT04-0000
EYP-BAL-0980-08000-4020-CMT04-0000
EYP-BAL-0980-15000-4020-CDL02-0000
EYP-BAL-0980-18000-4020-CDL02-0000
EYP-BAL-1064-08000-4020-CMT04-0000
EYP-BAL-1064-10000-4020-CDL02-0000
EYP-BAL-1064-16000-4020-CDL02-0000