Semiconductor Manufacturing

IC Testing

The analysis of failures in complex integrated circuits is possible by focusing the optical beam of high power lasers on the IC inducing local currents in the circuitry.

Products:

EYP-BAL-0808-07000-4020-CDL02-0000

EYP-BAL-0808-08000-4020-CMT04-0000

EYP-BAL-0980-08000-4020-CMT04-0000

EYP-BAL-0980-15000-4020-CDL02-0000

EYP-BAL-0980-18000-4020-CDL02-0000

EYP-BAL-1064-08000-4020-CMT04-0000

EYP-BAL-1064-10000-4020-CDL02-0000

EYP-BAL-1064-16000-4020-CDL02-0000