A powerful 800 mW single mode source at 808 nm striking a diffractive optical element creates an extremely precise test pattern - into the furthest corners
Stabilized RWS@785nm for laser speckle imaging (LSI) enabling prompt diagnosis.
Product Highlights
New 785 nm DFB laser in TO-5 package
At this year's virtual Photonics West from March 06 to 11, TOPTICA eagleyard will present the DFB-785 laser diode, a chip relaunch based on proven DFB...
With PolyChrome Berlin a hybrid, photonic integration platform is being developed with which a variety of novel applications in the fields of sensor...